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Image for Scanning Nonlinear Dielectric Microscopy : Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices

Scanning Nonlinear Dielectric Microscopy : Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices

By: Cho, Yasuo (Tohoku University, Japan)

Part of the Woodhead Publishing Series in Electronic and Optical Materials series
0128172460 / 9780128172469
Paperback / softback
537.622
21/05/2020
Usually dispatched within 4 weeks
United States
152 x 229 mm, 420 grams 256 pages, Approx. 120 illustrations (30 in full color); Illustrations, unspecified
Professional & Vocational  Learn More

Scanning Nonlinear Dielectric Microscopy: Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices is the definitive reference on an important tool to characterize ferroelectric, dielectric and semiconductor materials.

Written by the inventor, the book reviews the methods for applying the technique to key materials applications, including the measurement of ferroelectric materials at the atomic scale and the visualization and measurement of semiconductor materials and devices at a high level of sensitivity.

Finally, the book reviews new insights this technique has given to material and device physics in ferroelectric and semiconductor materials. The book is appropriate for those involved in the development of ferroelectric, dielectric and semiconductor materials devices in academia and industry.

BIC:

TGM Materials science, TJF Electronics engineering

Our price£115.48
RRP £155.00
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