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Scanning electron microscopy and x-ray microanalysis (3rd ed)

By: Echlin, Patrick Goldstein, Joseph Joy, David C. Lifshin, Eric Lyman, Charles E. Michael, J.R. Newbury, Dale E. Sawyer, Linda

0306472929 / 9780306472923
3 in stock Need More ?
586 p. : ill.
postgraduate  Learn More research & professional undergraduate
Previous ed.: New York: Plenum, 1992.

This text provides students as well as practitioners (engineers, technicians, physical and biological scientists, clinicians, and technical managers) with a comprehensive introduction to the field of Scanning Electron Microscopy (SEM) and X-ray microanalysis.

The authors emphasize the practical aspects of the techniques described.

Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers, the characteristics of electron beam - specimen interactions, image formation and interpretation, the use of x-rays for qualitative and quantitative analysis and the methodology for structural analysis using electron back-scatter diffraction.

SEM sample preparation methods for hard materials, polymers, and biological specimens are covered in separate chapters.

In addition, techniques for the elimination of charging in non-conducting specimens are detailed.

A data base of useful parameters for SEM and X-ray micro-analysis calculations and enhancements to the text chapters are available on an accompanying CD.


PDND Microscopy, TGM Materials science

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