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Multi-run memory tests for pattern sensitive faults (1st ed. 2019.)

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This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in modern semiconductor memory.

Formal methods for multi-run test generation and many solutions to increase their efficiency are described in detail.

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Product Details
Springer
3319912046 / 9783319912042
eBook (Adobe Pdf, EPUB)
06/07/2018
English
133 pages
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