International Conference on Residual Stresses 9 (ICRS 9)

This book presents the proceedings of the International Conference on Residual Stresses 9 and is devoted to the prediction/modelling, evaluation, control, and application of residual stresses in engineering materials.

The state of the art is presented by the contributions of researchers from both academia and industry.

New developments, on stress-measurement techniques, on modelling and prediction of residual stresses and on progress made in the fundamental understanding of the relation between the state of residual stress and the material properties, are highlighted.

Focal points of interest are: simulation of stress profiles, depth-resolved stress analysis using synchrotron radiation and phase transformations in welded structures.

This book offers an indispensable overview of the current understanding of the role of residual stresses in materials used in wide ranging application areas, such as, for example, microelectronic devices, sensors and actuators and machine parts, as in the automotive industry.Volume is indexed by Thomson Reuters CPCI-S (WoS).The 98 selected papers explore the nature and causes of residual stresses in materials as a step either to reducing them or putting them to good use.

They cover analyzing stress by diffraction methods, mechanical methods, and other methods; instrumental developments; stress gradients in thin films; local stresses in microstructures; manufacturing processes; mechanical surface treatment; welding and joining; and material loading, damage, and component life.

Among the topics are analyzing texture depth distribution by energy-dispersive diffraction, a standard sample package for calibrating X-ray stress measurement, studying ductile damage progression in an aluminum single crystal using synchrotron white X-ray, identifying weld residual stresses using diffraction methods and their effect on fatigue strength of high strength steel welds, and residual stresses in roller bearing components.