Image for Structural, Syntactic, and Statistical Pattern Recognition

Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings (1st ed. 2018)

Bai, Xiao(Edited by)Biggio, Battista(Edited by)Hancock, Edwin R.(Edited by)Ho, Tin Kam(Edited by)Robles-Kelly, Antonio(Edited by)Wilson, Richard C.(Edited by)
Part of the Image Processing, Computer Vision, Pattern Recognition, and Graphics series
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This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2018, held in Beijing, China, in August 2018. The 49 papers presented in this volume were carefully reviewed and selected from 75 submissions.

They were organized in topical sections named: classification and clustering; deep learning and neurla networks; dissimilarity representations and Gaussian processes; semi and fully supervised learning methods; spatio-temporal pattern recognition and shape analysis; structural matching; multimedia analysis and understanding; and graph-theoretic methods. 

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£44.99
Product Details
3319977849 / 9783319977843
Paperback / softback
004.6
02/08/2018
Switzerland
524 pages, 134 Illustrations, black and white; XIII, 524 p. 134 illus.
155 x 235 mm