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Physics and Applications of Non-Crystalline Semiconductors in Optoelectronics

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Measurement of Third-Order Nonlinearities in Amorphous Materials; M.

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Seddon, M.J. Laine. The Possibilities to Use the Intrinsic Defect's Optical Properties for Optoelectronics in Fused Silica; A.R.

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Fedtchouk, et al. Multiquantum Processes in Solids. New Aspects; V.A. Kovarsky. Bose-Einstein Condensation of Excitons in the Presence of Laser Radiation; S.A. Moskalenko, et al. Thermal, Plasma and Photoinduced Microstructural Changes on a-SiC:H Films; M.

Dinescu, et al. Some Electrophysical Properties of C60 Thin Films; A. Andriesh, et al. Deposition of CuInSe2 Thin Films by Pulsed Electron Beam Ablation; A.M. Andriesh, et al. Optical Properties of Ge-As-Se Glasses and Films on Their Basis; V. Bazakutsa, et al. Optical Registration Media with Near Insensibility for Xerography; A.

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Product Details
Springer
940115497X / 9789401154970
Paperback
04/10/2011
496 pages
156 x 234 mm, 689 grams