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Introduction to focused ion beams: instrumentation, theory, techniques, and practice

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Introduction to Focused Ion Beams is geared towards techniques and applications.

This is the only text that discusses and presents the theory directly related to applications andthe only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.

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£109.50
Product Details
Springer
038723313X / 9780387233130
eBook (Adobe Pdf)
28/06/2005
English
357 pages
Copy: 10%; print: 10%
general /postgraduate /research & professional /undergraduate Learn More
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