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Microelectronic Reliability - v. 1 : Reliability, Test and Diagnostics

Hakim, Edward B.(Edited by)
Part of the Materials science library series
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Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test.

Provides background on the development of quality assurance and verification procedures.

Some of the new changes under development to cope with pressures brought

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£124.00
Product Details
Artech House Publishers
0890062846 / 9780890062845
Hardback
621.381
31/01/1989
United States
396 pages, 1, black & white illustrations
152 x 229 mm, 750 grams
Professional & Vocational/Postgraduate, Research & Scholarly/Undergraduate Learn More