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Stress-induced Phenomena in Metallization : Third International Workshop - Thord International Workshop

Bravman, John(Edited by)Ho, P. S.(Edited by)Li, Che-Yu (Cornell University)(Edited by)Sanchez, John(Edited by)
Part of the Aip Conference Proceedings / Aip Conference Proceedings Stress-induced Phenomena Metallizat series
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This text is aimed at engineers and research scientists working in the fields of microelectronics and ma terials science. '

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£110.00
Product Details
1563964392 / 9781563964398
Hardback
621.395
12/09/1996
United States
English
320p.
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