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55th IEEE Device Research Conference (1997)

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These papers from the conference focus on the development and application of sensors and device results.

Topics include: scaled si technology/characterization; si C and diamond devices; and thin film transistors.

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£81.50
Product Details
I.E.E.E.Press
0780339118 / 9780780339118
Paperback
31/12/1997
United States
80 pages
216 x 279 mm
Professional & Vocational Learn More