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IEEE International Reliability Physics Symposium (Revised ed)

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This CD-ROM originates from the 2002 IEEE International Reliability Physics Symposium, and is concerned with electron devices.

Its contents include: non volatile memory; dielectrics; hot carriers; assembly/packaging; device dielectrics; interconnects; product reliability; and device and process.

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£169.50
Product Details
I.E.E.E.Press
0780373529 / 9780780373525
Paperback / softback
31/05/2002
United States
500 pages
216 x 279 mm
Professional & Vocational/Postgraduate, Research & Scholarly Learn More