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Asian Test Symposium 10th Anniversary Compendium of Papers

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Fifty-five papers are collected from ten years of meetings of the Asian Test Symposium, an international forum that discusses aspects of system, board, chip, and device testing in light of design, manufacturing, and field considerations.

Specific topics include a concurrent fault detection method fo

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£139.50
Product Details
I.E.E.E.Press
076951233X / 9780769512334
Paperback / softback
621.392
01/01/2001
United States
380 pages
Professional & Vocational/Postgraduate, Research & Scholarly/Undergraduate Learn More