Soft Error Mechanisms, Modeling and Mitigation

Thisbook introduces readers to various radiation soft-error mechanisms such as softdelays, radiation induced clock jitter and pulses, and single event (SE)coupling induced effects.

In addition to discussing various radiation hardeningtechniques for combinational logic, the author also describes new mitigationstrategies targeting commercial designs.

Coverage includes novel soft errormitigation techniques such as the Dynamic Threshold Technique and Soft ErrorFiltering based on Transmission gate with varied gate and body bias.

The discussion also includes modeling of SEcrosstalk noise, delay and speed-up effects.

Various mitigation strategies toeliminate SE coupling effects are also introduced.

Coverage also includes the reliability of lowpower energy-efficient designs and the impact of leakage power consumptionoptimizations on soft error robustness.

The author presents an analysis of various power optimization techniques,enabling readers to make design choices that reduce static power consumptionand improve soft error reliability at the same time.