Materials Characterisation on the Nanoscale

"Materials Characterisation on the Nanoscale Functional and structural materials are nowadays at least nanostructured in one dimension.

Modern high-resolution techniques, like scanning probe microscopy, FIB and interferometric techniques to measure local deformations, orientation imaging for local orientation changes of single grains and orientation contrast with FE-R/T/EM's are needed to characterize these materials und to understand their behaviour. Nanostructured system of special interest in this session are carbonaceous nanomaterials (especially carbon nanotubes, nanocarbon composites as well as diamond-like carbon).

Here, the above mentioned techniques not only will help to better understand the structure-property relationship but also give hints on controlling the design of carbon nanostructures with taylored properties. Contributions in the following areas are sought: techniques with high spatial resolution to characterize phases and boundaries preferably with a comparison to scattering methods (average) mechanical testing on the nanoscale, like nanoindentation and in-situ testing within a TEM, REM or SPM to measure the mechanical properties preferably on nanostructured materials Modelling and simulations which connect the microscopic properties with the macroscopic material properties Microscopic characterization of individual constituents of carbon nanomaterials (SEM, TEM, EELS, SPM) Bulk characterization of carbon nanomaterials (X-ray, neutrons, TGA, RBS, ICPS) Mechanical and electronic performance of individual nanometer-size carbon materials (SPM) Mechanical and electronic performance of bulk carbon nanomaterials Manipulation/Assembling of nanometer-size carbonobjects by SPM Spectroscopy on carbon nanomaterials (including in-situ diagnostics): Optical emission spectroscopy, Flourescence, XPS.

Electrochemical behaviour of carbon nanomaterials