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Optical Methods in Surface Metrology

Part of the SPIE milestone series series
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Topics in this volume include: comparison of interferometric contouring techniques; comparison of visibility of standard scratches; and near-grazing illumination and shadowing of rough surfaces.

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Product Details
SPIE Press
0819423475 / 9780819423474
Hardback
620.44
01/08/1996
United States
660 pages, Illustrations
Professional & Vocational/Postgraduate, Research & Scholarly/Undergraduate Learn More