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Progress in Transmission Electron Microscopy 1 : Concepts and Techniques

Zhang, Xiao-Feng(Edited by)Zhang, Ze(Edited by)
Part of the Springer series in surface sciences series
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Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science.

This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications.

Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.

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£129.99
Product Details
3540676805 / 9783540676805
Hardback
502.82
18/10/2001
Germany
367 pages, XVI, 367 p.
155 x 235 mm