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Test Conference : International Conference Proceedings

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ITC is a technical conference on the testing and total quality of integrated electronic circuits, and the assemblies and systems that are based on them.

This is a collection of papers covering topics such as; dynamic current testing; MCM systems design; memory test; and unpowered opens.

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Product Details
I.E.E.E.Press
0780350928 / 9780780350922
Paperback / softback
621.395
01/12/1998
United States
1100 pages
279 x 216 mm
Professional & Vocational/Technical / vocational (manuals etc) Learn More