Handbook of microscopy for nanotechnology

Nanotechnology is a field that has and will have substantial intrinsic merit to new technology advancement and to the world economy and quality of life.It is concerned with materials and systems whose structures and components exhibit novel physical, chemical and biological properties due to their small size. The aim is to exploit these properties by gaining control of structures and devices at atomic, molecular, and supra-molecular levels and to learn to efficiently manufacture and use these devices. The potential of this technology is almost beyond comprehension and may include applications such as systems that conduct electricity without loss, materials with orders of magnitude more strength than steel at only a small fraction of the weight, devices that store information comparable in size to the information contained in the Library of Congress so small as to fit into in a shirt pocket, and effective treatments and cures for many diseases.
Handbook of Microscopy in Nanotechnology aims to provide an overview of the basics and applications of various microscopy techniques for nanotechnology. The value of such a book is evident, since microscopy serves as the "eye" and "hand" of studying nanostructured materials. The structure-composition-processing-property relationships for these sub 100 nm-sized materials can only be understood by employing an array of modern microscopy and microanalysis tools. This book will highlight various microcopy techniques and their applications in this fast-growing field. Topics to be covered will include the following:
Scanning near field optical microscopy, Confocal optical microscopy, Atomic force microscopy, Magnetic force microscopy, Scanning turning microscopy, High resolution scanning electron microscopy, Orientational imaging microscopy, High-resolution transmission electron microscopy, Scanning transmission electron microscopy, Environmental transmission electron microscopy, Quantitative electron diffraction, Lorentz microscopy, Electron holography, 3-D transmission electron microscopy, High-spatial resolution quantitative microanalysis, Electron energy loss spectroscopy and spectral imaging, Focused ion beam, Secondary ion microscopy, Field ion microscopy.