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2000 IEEE International Workshop on Defect Based Testing (Dbt 2000) (2000 ed.)

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A study of defect based testing, containing papers from an IEEE workshop held in 2000.

Areas addressed include: deep sub-micron IDDQ testing; defect oriented testing; current measurement and yield; and current and voltage test techniques.

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Product Details
I.E.E.E.Press
0769506372 / 9780769506371
Paperback / softback
621.392
01/05/2000
United States
85 pages
Professional & Vocational/Postgraduate, Research & Scholarly/Undergraduate Learn More