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Semiconductor Materials : Characterisation Techniques

Vaya, P.R.(Edited by)
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In this work, scientists working in the field of semiconductor materials discuss the latest and the emerging techniques of characterization.

Topics covered include: ellipsometry; transmission electron microscopy; X-ray photoelectron spectroscopy; and electro-optic devices.

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£26.95
Product Details
Narosa Publishing House
8173190038 / 9788173190032
Hardback
537.622
01/10/1994
India
320 pages
Professional & Vocational/Postgraduate, Research & Scholarly Learn More