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Photo-assisted Kelvin Probe Force Microscopy Investigation of Three-dimensional GaN Structures

Part of the Berichte Aus Der Halbleitertechnik series
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£45.61
Product Details
Shaker Verlag GmbH, Germany
3844086749 / 9783844086744
Paperback / softback
13/07/2022
Germany
170 pages, 46
148 x 210 mm
Postgraduate, Research & Scholarly Learn More