Search Results - DK - Books - 201 - 300 - Tanner, Brian K.

X-ray metrology in semiconductor manufacturing

eBook 24 Jan 2006
Publisher CRC Press
ISBN: 9781420005653
Dewey: 621.38152
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£200.00
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High Resolution X-Ray Diffractometry And Topography

Hardback 5 Feb 1998
ISBN: 9780850667585
Dewey: 548.83
£153.00
RRP £180.00
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High resolution X-ray diffractometry and topography

Paperback / softback 10 Oct 2019
Publisher CRC Press
ISBN: 9780367400637
Dewey: 548.83
£52.69
RRP £61.99
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High resolution X-ray diffractometry and topography

Ebook 1 Nov 2005
Publisher CRC Press
ISBN: 9780203979198
Dewey: 548.83
Title Unavailable: Withdrawn
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