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Frontiers of characterization and metrology for nanoelectronics : 2007 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics, Gaithersburg, Maryland, 27-29 Marc

Part of the AIP Conference Proceedings / Materials Physics and Applications series
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This book contains peer-reviewed papers presented at the 2007 International Conference on Frontiers of Characterization and Metrology.

It emphasizes the frontiers of innovation in the characterization and metrology needed to advance nanoelectronics.

It provides an effective portrayal of the industry's characterization and metrology needs and how they are being addressed.

It also offers a foundation for further advances in metrology and new ideas for research and development.

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£106.00
Product Details
0735404410 / 9780735404410
Pbk. + CDROM
15/12/2007
United States
English
578 p. : ill. (some col.)
28 cm
Conference proceedings.