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Reliability for Logic and Memory Technologies - VHS Version

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This video, recorded at the December 1998 International Electronic Device Meeting, presents detailed discussions of the major reliability issues that face IC technology development and manufacturing as it enters the Giga-Scale era.

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Product Details
I.E.E.E.Press
078035303X / 9780780353039
VHS video
621.395
01/02/1999
United States
Professional & Vocational/Postgraduate, Research & Scholarly/Undergraduate Learn More