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New Trends & Potentialities of Tof-SIMS in Surface Studies

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This book presents the latest trends and applications of time-of-flight secondary ion mass spectrometry (ToF-SIMS).

It includes research and applications of the new primary ion guns.

It also describes new possibilities of mass spectrometers and instrumentation development.

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Product Details
Nova Science Publishers Inc
1600216358 / 9781600216350
Hardback
543.65
01/09/2007
United States
273 pages, Illustrations, unspecified
260 x 180 mm, 822 grams