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Microelectronic Reliability - v. 2 : Integrity, Assessment and Assurance

Pollino, Emiliano(Edited by)
Part of the Electronic Materials & Devices Library series
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A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics.

Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up.

Acidi

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Product Details
Artech House Publishers
0890063508 / 9780890063507
Hardback
621.381
01/04/1989
United States
556 pages, 1, black & white illustrations
152 x 229 mm, 982 grams