Search Results - Seiler, David G. - Books

Metrology and Diagnostic Techniques for Nanoelectronics

Hardback 3 Oct 2016
ISBN: 9789814745086
Dewey: 621.381
£284.75
RRP £335.00
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£19.99
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£87.00
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£235.50
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£130.50
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£184.62
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£106.00
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Frontiers of Characterization and Metrology for Nanoelectronics

Multiple-component retail product 26 Apr 2012
ISBN: 9780735409736
Dewey: 621.3815
£125.50
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£245.50
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£168.00
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Metrology and Diagnostic Techniques for Nanoelectronics

eBook 27 Mar 2017
ISBN: 9781351733946
Dewey: 621.381
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£370.00
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Metrology and diagnostic techniques for nanoelectronics

eBook 10 Mar 2017
ISBN: 9781351733953
Dewey: 621.381
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Narrow Gap Semiconductors and Related Materials

Hardback 1 May 1990
ISBN: 9780852742105
Dewey: 537.622
Out of Print
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£52.79
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